Zygo 'sVerifire Asphere+ (VFA+) sets a new standard for automated non-contact 3D surface metrology and process control for spherical, aspherical and free-form optics.
Aspherical optics enable significant benefits in the design and implementation of imaging, sensing and laser systems used in industries ranging from defense and aerospace to semiconductor exposure and control systems and medical imaging.
The production of aspheric optical devices that support these applications is dependent on precision metrology. After all, when it comes to aspheric optics, you can't make what you can't measure. Verifire Asphere+ takes advantage of Fizeau interferometry to provide a unique combination of accurate, fast, high-resolution, and fully aperture metrology for axisymmetric aspheres and beyond.
VFA+ provides a flexible metrology platform for measuring a wide range of axisymmetric aspheres with only a change of transmission sphere (lens). In addition, the VFA+ is equipped with an optional secondary stage that supports the use of a computer-generated hologram(CGH), extending the shape measurement capabilities to off-axis aspheric and non-axisymmetric free-form optics.
Key Features
- Industry-proven technology based on Zygo Verifire HD
- Accurate, non-contact surface metrology without the need to modify the feature being measured
- High measurement speed
- Repeatability in the order of nanometer units
- Autonomous measurement
- Metrology for spherical, aspherical and free-form surfaces
- Accurate RoC determination thanks to automatic 5-axis positioning with interferometric metering
- Integrated vibration isolation system
- Comprehensive Zygo Mx data visualization and analysis software
- CGH can be used to generate virtually any waveform
- Suitable for glasses, plastics, crystals, semiconductors, ceramics and metals
