The OptiSurf® PRO AR from TRIOPTICS is a measuring instrument designed to characterize the geometric properties of individual waveguides, layered waveguides and other plano-optical elements.
Stacked waveguides typically consist of 2 to 3 elements that are tilted at a specific angle to each other. An error in tilt can cause undesirable colour transmission errors. OptiSurf® PRO AR can measure this tilt very accurately. In particular, the tilt of the individual elements/layers of the waveguide relative to each other or to a mechanical reference. Another important application is the measurement of the Total Thickness Variation (TTV) on the waveguide surface, as too much thickness variation can fundamentally reduce the contrast (MTF Modulation Transfer Function) of the generated image.
Whether your field of expertise is manufacturing, research, or quality control of waveguide bundles or optical components, OptiSurf® PRO AR allows you to measure the thickness of individual centers and air gaps between components in a waveguide bundle with sub-micron accuracy. The software also analyzes tilt, surface shape and deflection.
Key features
Uniqueness
- OptiSurf® PRO AR enables accurate and reliable testing of geometric properties. It is the only measuring device available on the market that can accurately measure the inclination of individual elements of layered waveguides.
Accuracy
- The OptiSurf® PRO AR provides accurate measurement data, e.g. total thickness deviation (TTV), flatness and tilt of individual waveguides or plano-optical elements, as well as alignment (e.g. tilt and air gap distance) of the waveguide bundle. This is performed with the highest precision as part of a non-destructive measurement process.
Experience
- TRIOPTICS has extensive experience in the field of non-contact measurement of the central thickness of individual lenses and planar optics, as well as for the measurement of air distances in optical systems. All within the Optisurf® product portfolio.
