The Filmetrics® F20 thin film analyzer is available in several configurations, which differ primarily in their thickness measurement range (and spectrometer wavelengths) to suit a wide range of applications:
| Model |
Measurable thickness range |
Spectral range |
| F20 |
15 nm – 70 µm |
380 – 1050 nm |
| F20-EXR |
15 nm – 250 µm |
380 – 1700 nm |
| F20-NIR |
100 nm – 250 µm |
950 – 1700 nm |
| F20-UV |
1 nm – 40 µm |
190 – 1100 nm |
| F20-UVX |
1 nm – 250 µm |
190 – 1700 nm |
| F20-XT |
0.2 µm – 450 µm |
1440 – 1690 nm |
| F3-sX |
10 µm – 3 mm |
960 – 1580 nm |
Measurement point size: Standard 1.5 mm, with optional sizes up to 20 µm. For the F20-XT model, the standard point size is 600 µm.
Sample size: Samples with a diameter from 1 mm to 300 mm and more can be measured.
Measurement parameters: All F20 models support the measurement of thickness, refractive index, reflectance, and transmittance. They can characterize single- or multi-layer film sets, individual membranes, liquid films, or air gaps. Measurements can be performed on both flat and curved surfaces.
Software: Each system includes intuitive FILMeasure analysis software, which contains a library of more than 130 materials and provides access to hundreds more. It also allows you to measure and store refractive index values for new materials. It includes built-in online diagnostics and a history function for storing and plotting results.
