The SP-NG series single beam interferometer from SIOS is used for precision position and deflection measurements over time. It can be used with a plane mirror as well as a spherical or hollow retroreflector, and also allows measurements through small windows/apertures.
By using the highest quality, frequency and amplitude stabilized lasers, also manufactured directly by Sios Messtechnik, high reliability and measurement accuracy are guaranteed.
In the case of the use of a plane mirror, the lateral movement (x, y) of the interferometer mirror perpendicular to the measuring axis (z) is enabled. The use of a hollow or spherical retroreflector with high tilt (pitch, yaw, roll) invariance guarantees ease of use. The interferometer for length measurements is most commonly used for calibration of length measuring instruments, for multiple coordinate measurements, measurements on planar tables or eccentricity and concentricity measurements.
