Spectroscopic ellipsometer M-2000 from the leading American manufacturer J.A.Woollam Co.
It is an ellipsometer assembly with motorized goniometer for angular measurements and motorized feeds for sample mapping. By combining a fast CCD detector and patented RCE technology (rotating compensator ellipsometry), the M-2000 allows the M-2000 to measure ellipsometric data from the entire spectral range (here 193 - 1000 nm) with extreme sensitivity in a fraction of a second.
The offered system has versatile applications and is an ideal tool for studying the optical properties of thin films and multilayers, their uniformity, investigating nanostructures, detecting surface phase transitions, and measuring free charge carrier concentrations, provides the possibility of band structure studies (including critical points), the possibility of non-destructive studies of the refractive index profile in super-thin films, research of biomaterials and biosurfaces, time-resolved also allows the measurement of fast processes (such as layer deposition) and more...
The state-of-the-art CompleteEase software greatly facilitates work with ellipsometric data, offering the widest range of analytical models and a library of optical characterizations of a wide range of materials.
Device parameters
- Spectral range: 193 - 1000 nm (upgradable to 1690 nm)
- Angular range: 45° - 90°
- Number of measurable MM elements: 11
- Complete spectrum measurement time: < 0.1 s
- Motorized shifts: YES (100 mm x 100 mm range)
- Sample Mapping: YES
