OptiXs invites you to a webinar hosted by SIOS Messtechnik, which will introduce you to high-precision thickness measurement with contact probe gauges in 45 minutes.
Current trends in science and industry place high demands on precision measuring systems, especially their ability to determine the geometric dimensions of objects. One-dimensional thickness measurement of materials, among others, is becoming a particularly interesting application.
Specially developed measuring assemblies based on touch probes with precise interferometric measurement are able to determine thickness with measurement uncertainties in the order of nanometres. The measuring range ranges from tens of nanometers to tens of millimeters.
They are therefore an effective tool not only for comparing measuring blocks but also for measuring the thickness of optical elements and silicon wafers.
Schedule:
- Geometric thickness characteristics
- Basic principles of thickness measurement with a touch probe
- What factors affect the accuracy of the measurement?
- SIOS interferometric touch probes LM 20 and LM 50
- Example application: comparison of measuring blocks
- Application example: measuring lens thickness
- Application example: wafer thickness measurement
- How to increase the resolution and accuracy of existing length and thickness measurement setups using an interferometer?
When? 8.3.2022