We distribute this product only in the Czech Republic and Slovakia.

FusionScope AFM-in-SEM

FusionScope™ combines the complementary strengths of AFM and SEM in a single, easy-to-use platform. It fully integrates the wide range of advanced AFM measurement techniques with the benefits of SEM imaging. Seamlessly image a sample, identify areas of interest, measure a sample, and combine AFM and SEM measurement data in real time.

Electrical, nanomechanical and magnetic properties of your sample are available with just a click.

Perform a full suite of characterization techniques from high-resolution AFM and SEM imaging to analysis of topographic, nanomechanical, chemical, electrical and magnetic properties using correlation microscopy.

Alexandra Pešátová
Expert advisor

Mgr. Alexandra Pešátová

+420 725 945 076

pesatova@optixs.cz

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Parameters

The FusionScope is a correlation AFM/SEM microscope that has been designed from the ground up to allow the advantages of combining these two analytical methods to be seamlessly exploited. For most analyses, it is often desirable to analyze a sample with multiple techniques and look for correlations between parameters. For imaging techniques such as AFM and SEM, this often means that exactly the same area of the sample needs to be analysed. Instead of having to move the sample from one microscope to another or use two different operating systems to analyze the same spot on the sample, FusionScope provides coordinated complementary measurements at the same location within the same user interface. All of this translates into an easy-to-use system that is able to quickly provide more useful and new data.

FusionScope offers all the benefits of a full-featured atomic force microscope combined with SEM. It is capable of most common measurement modes expected from a standard AFM, including contact, dynamic and FIRE modes. With a simple click of a button, you can switch between the subnanometer resolution AFM and the SEM display to get the data you want. Interchangeable consoles easily provide advanced modes such as conductivity AFM (C-AFM) and magnetic force microscopy (MFM).

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Are you interested in product? Send us your requirements via the enquiry form or contact an expert consultant directly. We will be happy to answer your questions and propose a solution according to your needs.

Expert advisor

Alexandra Pešátová

Mgr. Alexandra Pešátová