FusionScope™ combines the complementary strengths of AFM and SEM in a single, easy-to-use platform. It fully integrates the wide range of advanced AFM measurement techniques with the benefits of SEM imaging. Seamlessly image a sample, identify areas of interest, measure a sample, and combine AFM and SEM measurement data in real time.
Electrical, nanomechanical and magnetic properties of your sample are available with just a click.
Perform a full suite of characterization techniques from high-resolution AFM and SEM imaging to analysis of topographic, nanomechanical, chemical, electrical and magnetic properties using correlation microscopy.