We distribute this product only in the Czech Republic and Slovakia.

Vero - interferometric AFM

Vero from Asylum Research is a family of atomic force microscopes with unique, patented QPDI (Quadrature Phase Differential Interferometry) technology offering an uncompromising combination of high resolution at high measurement speeds with a complete range of measurement modes.

Typical application areas

  • Semiconductors, Piezoelectrics
  • Nanomechanical testing
  • 2D materials

Key Features

  • Measures actual tip position - quantitative data
  • High stability, repeatability and resolution
  • Low noise and crosstalk elimination
  • Speed & accuracy
  • Flexibility - wide range of modes already in the basic configuration
  • Ease of operation and automation
Vero - interferometric AFM
Vero - interferometric AFM Vero - interferometric AFM Vero - interferometric AFM

Aplikační oblasti:

Alexandra Pešátová
Expert advisor

Mgr. Alexandra Pešátová

+420 725 945 076

pesatova@optixs.cz

Send inquiry

OptiXs care

  • We will expertly consult your planned application
  • Our team is able to integrate the product into a larger system
  • We ensure fast delivery of spare parts and local service
What else we can help with

Accessories

Standard measurement modes: Optional measurement modes:
Contact mode (DC) AM-FM Viscoelastic Mapping Mode
DART PFM Contact Resonance Viscoelastic Mapping Mode
Dual AC, Dual AC Resonance Tracking (DART) Conductive AFM (cAFM) with ORCA™ and Eclipse™ Mode
Electrostatic Force Microscopy (EFM) Current mapping with Fast Force Mapping
Force curves Electrochemical Strain Microscopy (ESM)
Force Mapping Mode (force volume) Fast Force Mapping Mode
Force modulation High voltage PFM
Frequency modulation Nanoscale Time Dependent Dielectric Breakdown (nanoTDDB)
Kelvin Probe Force Microscopy (KPFM) Scanning Microwave Impedance Microscopy (sMIM)
Lateral Force Mode (LFM) Scanning Tunneling Microscopy (STM)
Loss tangent imaging
Magnetic Force Microscopy (MFM) **************************
Nanolithography
Nanomanipulation blueDrive - photothermal excitation
Phase imaging Electrochemical cell (EC-AFM)
Piezoresponse Force Microscopy (PFM) Temperature and humidity control
Switching spectroscopy PFM Perfusion cell
Tapping mode (AC mode) Glove box compatibility
Tapping mode with digital Q control
Vector PFM

Video

Application

Optical characterization of nanostructures

Optical characterization of nanostructures

Nanostructures (quantum dots, nanocrystals, nanofibres, nanomembranes, nanotubes, ...) are referred to as objects with d..

Photovoltaics

Photovoltaics

In the context of the need to increase the energy and economic efficiency of solar cells, materials based on perovskites..

Energy storage

Energy storage

Energy storage is a key factor in the use of renewable energy and the transition to a more sustainable energy system. Ye..

Parameters

The Vero family of AFM microscopes consists of:

  • the basic Vero S model - very high resolution with fast scanning and a wide range of modes
  • Environmental AFM Vero ES - all the performance and features of the Vero S plus a wide range of exceptional environmental accessories with a sealed sample chamber

In addition to the standard AFM modes (tapping, contact mode, phase imaging), combined modes for measurements are also available:

  • electrical (PFM, cAFM, KPFM, EFM, ..) and magnetic (MFM).
  • thermal (SThM)
  • and mechanical properties (Force curves, Force mapping, FFM, contact resonance viscoelastic mapping, AM-FM, ...),
  • nanomanipulation and nanolithography, for example, and other possibilities.

Novinky

Asylum Research - our new partner in the field of AFM microscopy
Asylum Research - our new partner in the field of AFM microscopy

OptiXs has established a cooperation with Asylum Research - a technology leader among AFM microscope...

The new powerful and affordable Cypher L™ AFM microscope
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Breakthrough Interferometric AFM Vero
Breakthrough Interferometric AFM Vero

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Dokumenty

Technická poznámka - QPDI technologie

Žádost o stažení dokumentu

Datový List - VERO

Žádost o stažení dokumentu

Inquire product

Are you interested in product? Send us your requirements via the enquiry form or contact an expert consultant directly. We will be happy to answer your questions and propose a solution according to your needs.

Expert advisor

Alexandra Pešátová

Mgr. Alexandra Pešátová

tel: +420 725 945 076
mail: pesatova@optixs.cz